Produzione del chip standard cell AMchip03 Per SVT a CDF Breve descrizione dei tests del prototipo e...
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Transcript of Produzione del chip standard cell AMchip03 Per SVT a CDF Breve descrizione dei tests del prototipo e...
Produzione del chip standard cell AMchip03Per SVT a CDF
• Breve descrizione dei tests del prototipo e risultati
1. il chip funziona (up to now) 2. ma yield e’ basso 3. 37% perfetti, ~55-60% perfetti+ “quasi” perfetti
• Descrizione dell’ upgrade AM++ e sua flessibilita’
• Descrizione diverse possibilita’ di produzione e loro costi Servono almeno 70 kE aggiuntivi
AMchip03 status .• 126 dies produced by IMEC, 116 of which
came packaged. Arrived on September 30th• Simulation test vectors translated for the Test stand.• Test of all the chips in the Test stand
Inputs from Pattern
Generator
Output toLogic
Analyzer
AMChipsocket
The SCAM chip
Test VectorsThree types of tests:• Random Tests: 1) Generate Random Patterns
2) Generate Random Configurations
3) Send random Hits + good hits
• Memory Tests
• Feature Tests1) FSM
2) Jtag
3) Extest I/O
4) Opcode
SCAMChip internal Structure
Pattern Bank
Pattern Flux
Jtag
RoadsFrom AM
Roads to next AMchip
AMchip03 Test: Results
Yield (flawless) ≈ 37%
Yield (flawless + defective Patterns < 2) ≈ 53.5%
Yield (flawless + defective Patterns < 5) ≈ 59.5%
• We passed all the 116 chips through an intensive test at 100 nS.
• 8 AM chips tested @30nS to be mounted on a first LAMB++
Yield Expected 68%, based on IMEC’s predictions.
Yield puo’ fluttuare moltoproduzione calcolata su 35%
1 solo pattern wrong (preliminary tests) = 19/11616.4 %1 < Pattern wrong < 5 = 7/116 6.0%Pattern wrong>4 o other errors = 46/11639.7%
Good = 43/116 37.1%
BLOCCO 0 BLOCCO 1 BLOCCO 2 BLOCCO 3Pattern Layer Chip Pattern Layer Chip Pattern Layer Chip Pattern Layer Chip
0x0 0x800 819 1 34 0x1000 106B 4 8 0x18001000 0 76
0x100 1A3 2 23 0x900 0x1100 1190 2 2 0x1900 19C6 5 1031924 2 6
196C 5-4-1-0 62
0x200 240 1 78 0xA00 AFC ? 18 0x1200 122A 3 25 0x1A0012E0 2 98
0x300 378 4 109 0xB00 B0C 0 1 0x1300 133A 0 9 0x1B001367 2 33
0x400 4CA 1 17 0xC00 C39 ? 87 0x1400 1421 ? 111 0x1C00
0x4FF 0xCFF 0x14FF 0x1CFF
4 4 8 3
Test Stand – Vme CrateA complete system with an AMS/Pulsar, a merger and an AM++ with FPGAs has been tested with success @33MHz.
At the moment we can load 5000 patterns in AMchips and send Random Test Hits + good Hits.
Currently Testing with a Lamb++ equipped with 8 AMchips
Next step: adding a Lamb++ with 16 “defective”AMchips.
# Lambs (16 Amchips)/ SVTupg/ tot keurowedge SVTnow chips
2 Lamb: 160 kpatt/wedge 5 384 53 2003
+ spare ~500
8 Lamb: 640 kpatt/wedge 20 1536 93 2004
+ spare ~2000
Maximum L1 rate for 5% L2 dead time @3x1032
Current SVT Upgraded SVT
13 KHz 23 KHzGain of the 2004SVT upgrade
SVT Phyiscs Triggerrates: examples@3x1032
Trigger L1 Trigger rate
Z b-b 26 KHz
Hadronic B decay 177 KHz
Installazione2005
Eventuale completamento
AM
LAMB GLUE
Input Control
RECEIVERs & DRIVERs
LAMB CONNECTORs
VME INTERFACE
HIT
/RO
AD
CO
NN
EC
TO
R
TOP GLUE
PIPELINEREGISTERs
INDI
ToAMS
ClockDistrib.
AM++ (9U VME)MAX 2005: 640 Kpatt/wedge
Year chip boards devel. Total
2003? 120 kE10 kE (test b.) 5 kE 135 kE
2004 - 10 kE (protot.) 30 kE 40 kE
2005 53 kE 100 kE (produc.) 153 k
+40 kE +40 kE
+70 kE (produzione)
+40 kE tests di qualifica +25 kE package sottile
Upgrade 2004: 600 chipsUpgrade 2005: 2000 chips buoni Ipotesi 35/50% yield – fondi 95 + 60 keuros = 155 ke
Pilot Run: nuove maschere 210 k$ 1 wf 250 chips contro i 38 MPW
PILOT #good costo Mancanti costoRUN chips keuro keuro altrettanti#wafers chip12 1050/1500 215 60 26.4 k$25 2188/3125225 70 55 k$
MPW: buono per piccole produzioni usando mascheredel prototipo
Si paga solo il silicio ed i 5/6 del wafer si buttano!Con 128 wafers 1700/2430 chips - costo=240 keuro
Due strategie di produzione: MPW e Pilot Run
Conclusioni
•Il chip funziona (up to now)
•Yield ~ 37%•Forse si possono usare anche i quasi perfetti: 55-59%
•Yield puo’ fluttuare moltoproduzione calcolata su 35%•Pilot run: migliore garanzia per avere 2000 chips
•Si richiedono 70 keuro aggiuntivi per il pilot run
SVTBackup slides
backup
slides
Upgrade 2004: 600 chipsUpgrade 2005: 2000 chips buoni Ipotesi 35/50% yield – fondi 95 + 60 keuros = 155 ke
MPW #good costo Mancanti costoWafers chips keuro keuro /chip
50 665/950 130 0 184/128.5 E75 998/1425 185 30 177/124 E100 1330/1900190 35 138/96 E128 1700 240 85 138 E
PILOT #good costo Mancanti costoRUN chips keuro keuro /chip
12 1050/1500 215 60 198/139–32/22 E25 2188/3125225 70 101/71 –21/15 E
TsukubaChicago
Tempi di processamento: come agisce l’upgrade ?
Ricetta per velocizzare il tempo di esecuzione di SVT:
1. pattern piu’ sottili (AM grande) meno fits.
2. Road Warrior per rimuovere i ghosts
Hit Finders
Merger
Associative Memory
Hit Buffer
Track Fitter
to Level 2
COT tracks
fromXTRP
12 fibers
hits
roads
hits
x 12 phi sectors
Sequencerraw data fromSVX front end
NUOVA AM piu’ grande
Road Warrior
SVT exec time ~ proporzionale # candidati da fittare
TEMPI DI REALIZZAZIONE• Nuova AM-board: inizio estate 2004 (Pisa) durante estate 2004: test con FPGA (Pisa)
• Progetto prototipo AM-chip: luglio 2004 (Ferrara-Pisa)consegna chip ~2 mesi – disponibile ad ottobre.
• Nuova LAMB: montare nuovo AM-chip a ottobre 2004 (Pisa)
• test del chip + scheda: ottobre – dicembre 2004 (Pisa-Ferrara)
• produzione: inizio 2005 (Pisa-Ferrara)• installazione: estate 2005 (Pisa-Ferrara)• Altri DAQ/Trigger upgrade: previsti nel 2006
Road Warrior: . . . (~60 k$ Fermilab)
messa in opera entro fine 2003 F. Spinella (in funzione)
RW+TF: F>50s = 21%
Mezzanine slotsAUX card
Pulsar
CustomMezzanine
Bottom view
Worksup to
100MHz
Top view
Pulsar (Pulser And Recorder) Design
Three ALTERA APEX 20K400 FPGAs
I/O Mezzanine cards for: S-LINK (CERN/LHC) Hotlink TAXI to be specified
Self-testableModular, lego-style open design Replacing > 10 CDF board types all CDF, many ATLAS connectors/standards
AMchip
L. Zanello
Trigger/DAQ Upgrades for Run IIb• Need to Maintain or increase bandwidth
Luminosity Rate (=L) Luminosity inter/x-ing
Complexity (and fakes) Event Size, Exec. time
– All physics to tape
• L1 Bandwidth (output to L2)– XFT Purity trigger(L1, L2)– SVT, L2 L2 Exec. t L1 Bandwidth
• L2 Bandwidth (output to L3)– COT TDC Readout rate – Level 3 Processing L3 Exec. t– Event Builder Readout rate
• L3 Bandwidth (output to tape)– CSL Tape rate (not under IIb project)